Epsilon™( PATENTED TEWL MEASUREMENT SYSTEM )
₨ 0
This system provides linear and calibrated response, 256 levels of sensitivity, and artifact removal. It supports snapshot, burst, and event-triggered captures, with real-time RoI, histogram displays, and heterogeneity analysis. Ergonomically designed, it includes auto-save under study names and free software updates.
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Weight | 126 kg |
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